Possibly more so now than any time in the past, there are new microwave and millimeter-wave technologies with features and functions that are both higher performance and more diverse than previous technologies. These new technologies are the result of emerging applications with a wide range of new requirements and design constraints. The performance, features, and requirements of these new technologies and applications is, in turn, changing the landscape for microwave production and automated testing.
Greater emphasis is now being placed on test system stability and adaptability to a mix of specifications, as well as the need to meet the parameters of advanced millimeter-wave testing, higher test port counts, and test systems with increased levels of integration.